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Please use this identifier to cite or link to this item: http://hdl.handle.net/10204/3400

Title: Observation of Shapiro-steps in AFM-plought micron-size YBCO planar construction
Authors: Elkaseh, AAO
Srinivasu, VV
Perold, WJ
Keywords: Atomic force microscopy
AFM lithography
Josephson junction
YBCO
Shapiro-steps
AFM-plought micron-size
YBCO planar construction
Thin films
Photolithography
Issue Date: 2009
Publisher: Institute of Electrical and Electronics Engineers
Citation: Elkaseh, AAO, Srinivasu, VV and Perold, WJ. 2009. Observation of Shapiro-steps in AFM-plought micron-size YBCO planar construction. IEEE Transactions on Applied Superconductivity, Vol. (2009), pp 1-4
Abstract: Using an Atomic Force Microscope (AFM), micron size planar constriction type junctions was successfully ploughed on YBa2Cu3O7-x thin films. The 100 nanometer (nm) thin films are deposited on MgO substrates by an Inverted Cylindrical Magnetron (ICM) sputtering technique. The films are then patterned into 8-10 micron size strips, using photolithography and dry etching. A diamond coated tip was used with the AFM in this process. The authors were able to observe well defined current-voltage (I-V) characteristics and Shapiro-steps, successfully demonstrating a possible Josephson Effect in these constrictions
Description: Author Posting. Copyright Institute of Electrical and Electronics Engineers (IEEE), 2009. This is the author's version of the work. It is posted here by permission of IEEE for personal use, not for redistribution
URI: http://hdl.handle.net/10204/3400
ISSN: 1051-8223
Appears in Collections:Nanotechnology
Sensor science and technology
Manufacturing science and technology
General science, engineering & technology

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