Using an Atomic Force Microscope (AFM), micron size planar constriction type junctions was successfully ploughed on YBa2Cu3O7-x thin films. The 100 nanometer (nm) thin films are deposited on MgO substrates by an Inverted Cylindrical Magnetron (ICM) sputtering technique. The films are then patterned into 8-10 micron size strips, using photolithography and dry etching. A diamond coated tip was used with the AFM in this process. The authors were able to observe well defined current-voltage (I-V) characteristics and Shapiro-steps, successfully demonstrating a possible Josephson Effect in these constrictions
Reference:
Elkaseh, AAO, Srinivasu, VV and Perold, WJ. 2009. Observation of Shapiro-steps in AFM-plought micron-size YBCO planar construction. IEEE Transactions on Applied Superconductivity, Vol. (2009), pp 1-4
Elkaseh, A., Srinivasu, V., & Perold, W. (2009). Observation of Shapiro-steps in AFM-plought micron-size YBCO planar construction. http://hdl.handle.net/10204/3400
Elkaseh, AAO, VV Srinivasu, and WJ Perold "Observation of Shapiro-steps in AFM-plought micron-size YBCO planar construction." (2009) http://hdl.handle.net/10204/3400
Elkaseh A, Srinivasu V, Perold W. Observation of Shapiro-steps in AFM-plought micron-size YBCO planar construction. 2009; http://hdl.handle.net/10204/3400.
Author Posting. Copyright Institute of Electrical and Electronics Engineers (IEEE), 2009. This is the author's version of the work. It is posted here by permission of IEEE for personal use, not for redistribution
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