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dc.contributor.author Elkaseh, AAO
dc.contributor.author Srinivasu, VV
dc.contributor.author Perold, WJ
dc.date.accessioned 2009-05-26T13:07:14Z
dc.date.available 2009-05-26T13:07:14Z
dc.date.issued 2009
dc.identifier.citation Elkaseh, AAO, Srinivasu, VV and Perold, WJ. 2009. Observation of Shapiro-steps in AFM-plought micron-size YBCO planar construction. IEEE Transactions on Applied Superconductivity, Vol. (2009), pp 1-4 en
dc.identifier.issn 1051-8223
dc.identifier.uri http://hdl.handle.net/10204/3400
dc.description Author Posting. Copyright Institute of Electrical and Electronics Engineers (IEEE), 2009. This is the author's version of the work. It is posted here by permission of IEEE for personal use, not for redistribution en
dc.description.abstract Using an Atomic Force Microscope (AFM), micron size planar constriction type junctions was successfully ploughed on YBa2Cu3O7-x thin films. The 100 nanometer (nm) thin films are deposited on MgO substrates by an Inverted Cylindrical Magnetron (ICM) sputtering technique. The films are then patterned into 8-10 micron size strips, using photolithography and dry etching. A diamond coated tip was used with the AFM in this process. The authors were able to observe well defined current-voltage (I-V) characteristics and Shapiro-steps, successfully demonstrating a possible Josephson Effect in these constrictions en
dc.language.iso en en
dc.publisher Institute of Electrical and Electronics Engineers en
dc.subject Atomic force microscopy en
dc.subject AFM lithography en
dc.subject Josephson junction en
dc.subject YBCO en
dc.subject Shapiro-steps en
dc.subject AFM-plought micron-size en
dc.subject YBCO planar construction en
dc.subject Thin films en
dc.subject Photolithography en
dc.title Observation of Shapiro-steps in AFM-plought micron-size YBCO planar construction en
dc.type Article en


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