dc.contributor.author |
Mhlongo, Gugu H
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|
dc.contributor.author |
Ntwaeaborwa, OM
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|
dc.contributor.author |
Dhlamini, MS
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|
dc.contributor.author |
Swart, HC
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|
dc.contributor.author |
Hillie, KT
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|
dc.date.accessioned |
2012-03-02T13:08:53Z |
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dc.date.available |
2012-03-02T13:08:53Z |
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dc.date.issued |
2011-02 |
|
dc.identifier.citation |
Mhlongo, GH, Ntwaeaborwa, OM, Dhlamini, MS, Swart, HC and Hillie, KT. 2011. Effects of Ce3+ concentration, beam voltage and current on the cathodoluminescence intensity of SiO2: Pr3+–Ce3+ nanophosphor. Journal of Alloys and Compounds, vol. 509(6), pp 2986–2992 |
en_US |
dc.identifier.issn |
0925-8388 |
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dc.identifier.uri |
http://www.sciencedirect.com/science/article/pii/S0925838810029427
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|
dc.identifier.uri |
http://hdl.handle.net/10204/5627
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|
dc.description |
Copyright: 2011 Elsevier. This is an ABSTRACT ONLY. |
en_US |
dc.description.abstract |
SiO2:Pr3+–Ce3+ phosphor powders were successfully prepared using a sol–gel process. The concentration of Pr3+ was fixed at 0.2 mol% while that of Ce3+ was varied in the range of 0.2–2 mol%. High resolution transmission electron microscopy (HRTEM) clearly showed nanoclusters of Pr and Ce present in the amorphous SiO2 matrix, field emission scanning electron microscopy (FE-SEM) indicated that SiO2 clustered nanoparticles from 20 to 120 nm were obtained. Si–O–Si asymmetric stretching was measured with Fourier transform-IR (FT-IR) spectroscopy and it was also realized that this band increased with incorporation of the activator ions into the SiO2 matrix. The broad blue emission from the Ce3+ ions attributed to the 5d1–4f1 transition was observed from the SiO2:0.2 mol% Pr3+–1 mol% Ce3+ phosphor. This emission was slightly enhanced compared to that of the singly doped SiO2:1 mol%Ce3+ phosphor. Further investigations were conducted where the CL intensity was measured at different beam voltages and currents from 1 to 5 kV and 8.5 to 30 µA, respectively, in order to study their effects on the CL intensity of SiO2:0.2 mol% Pr3+–1 mol% Ce3+. The electron-beam dissociated the SiO2 and as a result an oxygen-deficient surface dead or non-luminescent layer of SiOx, where x < 2 on the surface, was formed. |
en_US |
dc.language.iso |
en |
en_US |
dc.publisher |
Elsevier |
en_US |
dc.relation.ispartofseries |
Workflow;7877 |
|
dc.relation.ispartofseries |
Workflow;8120 |
|
dc.subject |
Cathodoluminescence |
en_US |
dc.subject |
Energy transfer |
en_US |
dc.subject |
Degradation |
en_US |
dc.title |
Effects of Ce3+ concentration, beam voltage and current on the cathodoluminescence intensity of SiO2: Pr3+–Ce3+ nanophosphor |
en_US |
dc.type |
Article |
en_US |
dc.identifier.apacitation |
Mhlongo, G. H., Ntwaeaborwa, O., Dhlamini, M., Swart, H., & Hillie, K. (2011). Effects of Ce3+ concentration, beam voltage and current on the cathodoluminescence intensity of SiO2: Pr3+–Ce3+ nanophosphor. http://hdl.handle.net/10204/5627 |
en_ZA |
dc.identifier.chicagocitation |
Mhlongo, Gugu H, OM Ntwaeaborwa, MS Dhlamini, HC Swart, and KT Hillie "Effects of Ce3+ concentration, beam voltage and current on the cathodoluminescence intensity of SiO2: Pr3+–Ce3+ nanophosphor." (2011) http://hdl.handle.net/10204/5627 |
en_ZA |
dc.identifier.vancouvercitation |
Mhlongo GH, Ntwaeaborwa O, Dhlamini M, Swart H, Hillie K. Effects of Ce3+ concentration, beam voltage and current on the cathodoluminescence intensity of SiO2: Pr3+–Ce3+ nanophosphor. 2011; http://hdl.handle.net/10204/5627. |
en_ZA |
dc.identifier.ris |
TY - Article
AU - Mhlongo, Gugu H
AU - Ntwaeaborwa, OM
AU - Dhlamini, MS
AU - Swart, HC
AU - Hillie, KT
AB - SiO2:Pr3+–Ce3+ phosphor powders were successfully prepared using a sol–gel process. The concentration of Pr3+ was fixed at 0.2 mol% while that of Ce3+ was varied in the range of 0.2–2 mol%. High resolution transmission electron microscopy (HRTEM) clearly showed nanoclusters of Pr and Ce present in the amorphous SiO2 matrix, field emission scanning electron microscopy (FE-SEM) indicated that SiO2 clustered nanoparticles from 20 to 120 nm were obtained. Si–O–Si asymmetric stretching was measured with Fourier transform-IR (FT-IR) spectroscopy and it was also realized that this band increased with incorporation of the activator ions into the SiO2 matrix. The broad blue emission from the Ce3+ ions attributed to the 5d1–4f1 transition was observed from the SiO2:0.2 mol% Pr3+–1 mol% Ce3+ phosphor. This emission was slightly enhanced compared to that of the singly doped SiO2:1 mol%Ce3+ phosphor. Further investigations were conducted where the CL intensity was measured at different beam voltages and currents from 1 to 5 kV and 8.5 to 30 µA, respectively, in order to study their effects on the CL intensity of SiO2:0.2 mol% Pr3+–1 mol% Ce3+. The electron-beam dissociated the SiO2 and as a result an oxygen-deficient surface dead or non-luminescent layer of SiOx, where x < 2 on the surface, was formed.
DA - 2011-02
DB - ResearchSpace
DP - CSIR
KW - Cathodoluminescence
KW - Energy transfer
KW - Degradation
LK - https://researchspace.csir.co.za
PY - 2011
SM - 0925-8388
T1 - Effects of Ce3+ concentration, beam voltage and current on the cathodoluminescence intensity of SiO2: Pr3+–Ce3+ nanophosphor
TI - Effects of Ce3+ concentration, beam voltage and current on the cathodoluminescence intensity of SiO2: Pr3+–Ce3+ nanophosphor
UR - http://hdl.handle.net/10204/5627
ER -
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en_ZA |