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Characterisation of InAs-based epilayers by FTIR spectroscopy

Author: Baisitse, TR ; Forbes, A ; Katumba, G ; Botha, JR ; Engelbrecht, JAA Date: 2008 In this paper, infrared reflectance spectroscopy was employed to extract information on the optical and electrical properties of metal organic vapour phase epitaxial (MOVPE) grown InAs and InAsSb epilayers. These epitaxial layers were grown ... Read more

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Browsing by Subject "Infrared reflectance spectroscopy"

Browsing by Subject "Infrared reflectance spectroscopy"

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