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Browsing by Subject "GaAs"

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  • Baisitse, TR; Forbes, A; Katumba, G; Botha, JR; Engelbrecht, JAA (John Wiley & Sons Ltd, 2008)
    In this paper, infrared reflectance spectroscopy was employed to extract information on the optical and electrical properties of metal organic vapour phase epitaxial (MOVPE) grown InAs and InAsSb epilayers. These epitaxial ...