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Observation of Shapiro-steps in AFM-plought micron-size YBCO planar construction

Author: Elkaseh, AAO ; Srinivasu, VV ; Perold, WJ Date: 2009 Using an Atomic Force Microscope (AFM), micron size planar constriction type junctions was successfully ploughed on YBa2Cu3O7-x thin films. The 100 nanometer (nm) thin films are deposited on MgO substrates by an Inverted Cylindrical Magnetron ... Read more

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Browsing by Subject "Shapiro-steps"

Browsing by Subject "Shapiro-steps"

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