Mgangira, Martin B2008-08-212008-08-212008-07Mgangira, M.B. 2008. Microstructural pavement material characterization: some examples. Partnership for research and progress in Transportation. 27th Southern African Transport Conference (SATC), Pretoria, South Africa, July 7-11, 2008, pp 12978-1-920017-34-7http://hdl.handle.net/10204/2403Paper presented at the 27th Annual Southern African Transport Conference 7 - 11 July 2008 "Partnership for research and progress in transportation", CSIR International Convention Centre, Pretoria, South AfricaThe utilisation of advanced measurement techniques should assist in the characterization of pavement materials at a micro-scale. The motivating factor for such an approach is that material properties at the micro-level have a critical role in the way materials respond to loading at the macro-level. The objective of the paper is to demonstrate how Scanning Electron Microscopy (SEM) as an example of advanced measurement techniques was used for material characterization. A range of samples of pavement engineering materials were examined at a micro-scale using the technique. Selected examples of material characterization are presented. The potential application of microstructural material characterization for the identification of key elements which provide the opportunity to understand fundamental behaviour of pavement engineering materials is demonstratedenSEMScanning Electron MicroscopyPavement materialsMeasurement techniquesSATCConference PresentationMgangira, M. B. (2008). Microstructural pavement material characterization: some examples. Southern African Transport Conference (SATC). http://hdl.handle.net/10204/2403Mgangira, Martin B. "Microstructural pavement material characterization: some examples." (2008): http://hdl.handle.net/10204/2403Mgangira MB, Microstructural pavement material characterization: some examples; Southern African Transport Conference (SATC); 2008. http://hdl.handle.net/10204/2403 .TY - Conference Presentation AU - Mgangira, Martin B AB - The utilisation of advanced measurement techniques should assist in the characterization of pavement materials at a micro-scale. The motivating factor for such an approach is that material properties at the micro-level have a critical role in the way materials respond to loading at the macro-level. The objective of the paper is to demonstrate how Scanning Electron Microscopy (SEM) as an example of advanced measurement techniques was used for material characterization. A range of samples of pavement engineering materials were examined at a micro-scale using the technique. Selected examples of material characterization are presented. The potential application of microstructural material characterization for the identification of key elements which provide the opportunity to understand fundamental behaviour of pavement engineering materials is demonstrated DA - 2008-07 DB - ResearchSpace DP - CSIR KW - SEM KW - Scanning Electron Microscopy KW - Pavement materials KW - Measurement techniques KW - SATC LK - https://researchspace.csir.co.za PY - 2008 SM - 978-1-920017-34-7 T1 - Microstructural pavement material characterization: some examples TI - Microstructural pavement material characterization: some examples UR - http://hdl.handle.net/10204/2403 ER -