Pienaar, CiaraOdendaal, JWJoubert, JPienaar, MSmit, Johan C2019-04-122019-04-122017-09Pienaar, C., Odendaal, J.W., Joubert, J., Pienaar, M. & Smit, J.C. 2017. Comparison of various CEM methods to predict RCS of lossy dielectrics. In: 2017 International Conference on Electromagnetics in Advanced Applications (ICEAA), 11-15 September 2017, Verona, Italy978-1-5090-4452-8https://goo.gl/daq1QZhttp://hdl.handle.net/10204/109622017 International Conference on Electromagnetics in Advanced Applications (ICEAA), 11-15 September 2017, Verona, Italy. Due to copyright restrictions, the attached PDF file only contains the abstract of the full-text item. For access to the full-text item, please consult the publisher's website. While waiting for the post-print or published PDF document from the publisherThe accuracy with which various full-wave and asymptotic CEM techniques can calculate the RCS of lossy dielectric objects is investigated. This is conducted through comparison to measured RCS data. The investigated methods include MLFMM, FEM, PO and RL-GO. Different lossy dielectric materials are used to construct canonical targets. The RCS of these targets are measured in a compact range at the University of Pretoria, South Africa. The material properties of these lossy dielectrics are accurately characterised using a waveguide technique. Accurate CAD models of the dielectric objects are constructed and used for simulations. The calculated RCS results are compared to the measurements to determine the accuracy of the various methods. The performance and computational efficiency of these methods are also investigated.enComputational electromagneticCEM modellingDielectric scatteringRadar Cross SectionRCSRCS measurementsComparison of various CEM methods to predict RCS of lossy dielectricsConference PresentationPienaar, C., Odendaal, J., Joubert, J., Pienaar, M., & Smit, J. C. (2017). Comparison of various CEM methods to predict RCS of lossy dielectrics. IEEE. http://hdl.handle.net/10204/10962Pienaar, Ciara, JW Odendaal, J Joubert, M Pienaar, and Johan C Smit. "Comparison of various CEM methods to predict RCS of lossy dielectrics." (2017): http://hdl.handle.net/10204/10962Pienaar C, Odendaal J, Joubert J, Pienaar M, Smit JC, Comparison of various CEM methods to predict RCS of lossy dielectrics; IEEE; 2017. http://hdl.handle.net/10204/10962 .TY - Conference Presentation AU - Pienaar, Ciara AU - Odendaal, JW AU - Joubert, J AU - Pienaar, M AU - Smit, Johan C AB - The accuracy with which various full-wave and asymptotic CEM techniques can calculate the RCS of lossy dielectric objects is investigated. This is conducted through comparison to measured RCS data. The investigated methods include MLFMM, FEM, PO and RL-GO. Different lossy dielectric materials are used to construct canonical targets. The RCS of these targets are measured in a compact range at the University of Pretoria, South Africa. The material properties of these lossy dielectrics are accurately characterised using a waveguide technique. Accurate CAD models of the dielectric objects are constructed and used for simulations. The calculated RCS results are compared to the measurements to determine the accuracy of the various methods. The performance and computational efficiency of these methods are also investigated. DA - 2017-09 DB - ResearchSpace DP - CSIR KW - Computational electromagnetic KW - CEM modelling KW - Dielectric scattering KW - Radar Cross Section KW - RCS KW - RCS measurements LK - https://researchspace.csir.co.za PY - 2017 SM - 978-1-5090-4452-8 T1 - Comparison of various CEM methods to predict RCS of lossy dielectrics TI - Comparison of various CEM methods to predict RCS of lossy dielectrics UR - http://hdl.handle.net/10204/10962 ER -