Jafta, CJRoos, WDTerblans, JJ2013-09-302013-09-302013-03Jafta, C.J, Roos, W.D and Terblans, J.J. 2013. Modification to an Auger Electron Spectroscopy system for measuring segregation in a bi-crystal. Journal of Instrumentation, vol. 8, pp 1-61748-0221http://hdl.handle.net/10204/6970Copyright: 2013 IOP Publishing. This is an ABSTRACT ONLY. The definition version is published in Journal of Instrumentation, vol. 8, pp 1-6It is reported that different crystal surface orientations yield different segregation fluxes. Although there were a few attempts to confirm these predictions experimentally, it is very difficult to compare data without making a few assumptions. Parameters like temperature measurement, crystal history and spectrometer variables are all adding to the complexity of directly comparing the segregation behaviour from one crystal to another. This investigation makes use of a Cu bi-crystal, modifications to the scanning control unit of the AES electron beam to eliminate the difference in experimental parameters and specialized written software to automate the data acquisition process. This makes direct comparison of segregation parameters on two different orientations possible. The paper describes the electron beam modifications, experimental setup and procedures, as well as the software developed to control the electron beam and automate data acquisition.enAuger Electron SpectroscopyElectron beam modificationsData distributionArchivingDetector designConstruction technologiesArticleJafta, C., Roos, W., & Terblans, J. (2013). Modification to an Auger Electron Spectroscopy system for measuring segregation in a bi-crystal. http://hdl.handle.net/10204/6970Jafta, CJ, WD Roos, and JJ Terblans "Modification to an Auger Electron Spectroscopy system for measuring segregation in a bi-crystal." (2013) http://hdl.handle.net/10204/6970Jafta C, Roos W, Terblans J. Modification to an Auger Electron Spectroscopy system for measuring segregation in a bi-crystal. 2013; http://hdl.handle.net/10204/6970.TY - Article AU - Jafta, CJ AU - Roos, WD AU - Terblans, JJ AB - It is reported that different crystal surface orientations yield different segregation fluxes. Although there were a few attempts to confirm these predictions experimentally, it is very difficult to compare data without making a few assumptions. Parameters like temperature measurement, crystal history and spectrometer variables are all adding to the complexity of directly comparing the segregation behaviour from one crystal to another. This investigation makes use of a Cu bi-crystal, modifications to the scanning control unit of the AES electron beam to eliminate the difference in experimental parameters and specialized written software to automate the data acquisition process. This makes direct comparison of segregation parameters on two different orientations possible. The paper describes the electron beam modifications, experimental setup and procedures, as well as the software developed to control the electron beam and automate data acquisition. DA - 2013-03 DB - ResearchSpace DP - CSIR KW - Auger Electron Spectroscopy KW - Electron beam modifications KW - Data distribution KW - Archiving KW - Detector design KW - Construction technologies LK - https://researchspace.csir.co.za PY - 2013 SM - 1748-0221 T1 - Modification to an Auger Electron Spectroscopy system for measuring segregation in a bi-crystal TI - Modification to an Auger Electron Spectroscopy system for measuring segregation in a bi-crystal UR - http://hdl.handle.net/10204/6970 ER -