Elkaseh, AAOSrinivasu, VVPerold, WJ2009-05-262009-05-262009Elkaseh, AAO, Srinivasu, VV and Perold, WJ. 2009. Observation of Shapiro-steps in AFM-plought micron-size YBCO planar construction. IEEE Transactions on Applied Superconductivity, Vol. (2009), pp 1-41051-8223http://hdl.handle.net/10204/3400Author Posting. Copyright Institute of Electrical and Electronics Engineers (IEEE), 2009. This is the author's version of the work. It is posted here by permission of IEEE for personal use, not for redistributionUsing an Atomic Force Microscope (AFM), micron size planar constriction type junctions was successfully ploughed on YBa2Cu3O7-x thin films. The 100 nanometer (nm) thin films are deposited on MgO substrates by an Inverted Cylindrical Magnetron (ICM) sputtering technique. The films are then patterned into 8-10 micron size strips, using photolithography and dry etching. A diamond coated tip was used with the AFM in this process. The authors were able to observe well defined current-voltage (I-V) characteristics and Shapiro-steps, successfully demonstrating a possible Josephson Effect in these constrictionsenAtomic force microscopyAFM lithographyJosephson junctionYBCOShapiro-stepsAFM-plought micron-sizeYBCO planar constructionThin filmsPhotolithographyArticleElkaseh, A., Srinivasu, V., & Perold, W. (2009). Observation of Shapiro-steps in AFM-plought micron-size YBCO planar construction. http://hdl.handle.net/10204/3400Elkaseh, AAO, VV Srinivasu, and WJ Perold "Observation of Shapiro-steps in AFM-plought micron-size YBCO planar construction." (2009) http://hdl.handle.net/10204/3400Elkaseh A, Srinivasu V, Perold W. Observation of Shapiro-steps in AFM-plought micron-size YBCO planar construction. 2009; http://hdl.handle.net/10204/3400.TY - Article AU - Elkaseh, AAO AU - Srinivasu, VV AU - Perold, WJ AB - Using an Atomic Force Microscope (AFM), micron size planar constriction type junctions was successfully ploughed on YBa2Cu3O7-x thin films. The 100 nanometer (nm) thin films are deposited on MgO substrates by an Inverted Cylindrical Magnetron (ICM) sputtering technique. The films are then patterned into 8-10 micron size strips, using photolithography and dry etching. A diamond coated tip was used with the AFM in this process. The authors were able to observe well defined current-voltage (I-V) characteristics and Shapiro-steps, successfully demonstrating a possible Josephson Effect in these constrictions DA - 2009 DB - ResearchSpace DP - CSIR KW - Atomic force microscopy KW - AFM lithography KW - Josephson junction KW - YBCO KW - Shapiro-steps KW - AFM-plought micron-size KW - YBCO planar construction KW - Thin films KW - Photolithography LK - https://researchspace.csir.co.za PY - 2009 SM - 1051-8223 T1 - Observation of Shapiro-steps in AFM-plought micron-size YBCO planar construction TI - Observation of Shapiro-steps in AFM-plought micron-size YBCO planar construction UR - http://hdl.handle.net/10204/3400 ER -