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dc.contributor.author Grobler, Inus
dc.contributor.author Gitau, MN
dc.date.accessioned 2013-10-23T12:20:34Z
dc.date.available 2013-10-23T12:20:34Z
dc.date.issued 2009-09
dc.identifier.citation Grobler, I and Gitau, M.N. 2009. Common mode noise in three-level DC-DC converters. In: IEEE Africon 2009, Nairobi, Kenya, 23-25 September 2009 en_US
dc.identifier.isbn 9781424439188
dc.identifier.uri http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5308155
dc.identifier.uri http://hdl.handle.net/10204/7012
dc.description IEEE Africon 2009, Nairobi, Kenya, 23-25 September 2009. Abstract only attached. Published in IEEE Xplore. en_US
dc.description.abstract This paper demonstrates how conducted Electromagnetic Interference (EMI) can be easily analysed utilising an inexpensive and user friendly software package called Micro Cap 9 developed by Spectrum Software®. Other software packages generally used for accurate conducted EMI simulation purposes, such as SABER® is inaccessible to the general designer due to cost. The buck converter is shown as an example. Comparison is made between common mode currents in a standard two-level converter and also three-level derivations. Advantages of three-level converters include reduced switch voltage stress, lower distortion reactive power demand and improved dynamic response. The lower dv/dt should lead to lower electromagnetic noise generation. This paper will show that three-level buck DC-DC converters in general generate much lower common mode currents than conventional two-level buck converters. Further, reductions in common mode currents are achieved by using the improved three-level topologies that have been recently proposed. en_US
dc.language.iso en en_US
dc.publisher IEEE Xplore en_US
dc.relation.ispartofseries Workflow;2420
dc.subject DC-DC power convertors en_US
dc.subject Electromagnetic interference en_US
dc.subject Common mode noise en_US
dc.subject Three-level DC-DC converters en_US
dc.title Common mode noise in three-level DC-DC converters en_US
dc.type Presentation en_US


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