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Browsing National Centre for Nano-Structured Materials by Subject "Red-shift"

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  • Akande, Amos A; Machatine, AGJ; Masina, Bathusile N; Chimowa, G; Matsoso, B; Roro, Kittessa T; Duvenhage, M-M; Swart, H; Bandyopadhyay, J; Ray, Suprakas S; Mwakikunga, Bonex W (IOP Publishing, 2018-01)
    A layer of ~30 nm V2O5/100 nm-SiO2 on Si was employed in the in situ Raman spectroscopy in the presence of NH3 effluent from a thermal decomposition of ammonium acetate salt with the salt heated at 100 °C. When the layer ...

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