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Browsing by Subject "X-ray diffractometry"

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  • Van Staden, WF; Buttner, U; Fourie, CJ; Srinivasu, VV; Hardie, GL; Perold, WJ (Proceedings of the South African Conference on Semi and Superconductor Technology (SACSST) 2009, 2009-04)
    Bilayers of PBCO and YBCO are grown epitaxially on MgO substrates using PLD. In this paper, researchers discuss the entire optimization process in detail, giving quantitative parameter values. Film characterization included ...

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