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Binary naive Bayesian classifiers for correlated Gaussian features: a theoretical analysis

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dc.contributor.author Van Dyk, E
dc.contributor.author Barnard, E
dc.date.accessioned 2012-01-27T08:58:50Z
dc.date.available 2012-01-27T08:58:50Z
dc.date.issued 2008-11
dc.identifier.citation Van Dyk, E and Barnard, E. 2008. Binary naive Bayesian classifiers for correlated Gaussian features: a theoretical analysis. Nineteenth Annual Symposium of the Pattern Recognition Association of South Africa (PRASA 2008), Cape Town, South Africa, 27-28 November 2008 en_US
dc.identifier.isbn 9780799223507
dc.identifier.uri http://hdl.handle.net/10204/5543
dc.description Nineteenth Annual Symposium of the Pattern Recognition Association of South Africa (PRASA 2008), Cape Town, South Africa, 27-28 November 2008 en_US
dc.description.abstract We investigate the use of Naive Bayesian classifiers for correlated Gaussian feature spaces and derive error estimates for these classifiers. The error analysis is done by developing an exact expression for the error performance of a binary classifier with Gaussian features while using any quadratic decision boundary. Therefore, the analysis is not restricted to Naive Bayesian classifiers alone and can, for instance, be used to calculate the Bayes error performance. We compare the analytical error rate to that obtained when Monte-Carlo simulations are performed for a 2 and 12 dimensional binary classification problem. Finally, we illustrate the robust performances obtained with Naive Bayesian classifiers (as opposed to a maximum likelihood classifier) for high dimensional problems when data sparsity becomes an issue. en_US
dc.language.iso en en_US
dc.publisher PRASA 2008 en_US
dc.subject Naive Bayesian classifiers en_US
dc.subject Gaussian features en_US
dc.subject Pattern recognition en_US
dc.subject PRASA 2008 en_US
dc.title Binary naive Bayesian classifiers for correlated Gaussian features: a theoretical analysis en_US
dc.type Conference Presentation en_US
dc.identifier.apacitation Van Dyk, E., & Barnard, E. (2008). Binary naive Bayesian classifiers for correlated Gaussian features: a theoretical analysis. PRASA 2008. http://hdl.handle.net/10204/5543 en_ZA
dc.identifier.chicagocitation Van Dyk, E, and E Barnard. "Binary naive Bayesian classifiers for correlated Gaussian features: a theoretical analysis." (2008): http://hdl.handle.net/10204/5543 en_ZA
dc.identifier.vancouvercitation Van Dyk E, Barnard E, Binary naive Bayesian classifiers for correlated Gaussian features: a theoretical analysis; PRASA 2008; 2008. http://hdl.handle.net/10204/5543 . en_ZA
dc.identifier.ris TY - Conference Presentation AU - Van Dyk, E AU - Barnard, E AB - We investigate the use of Naive Bayesian classifiers for correlated Gaussian feature spaces and derive error estimates for these classifiers. The error analysis is done by developing an exact expression for the error performance of a binary classifier with Gaussian features while using any quadratic decision boundary. Therefore, the analysis is not restricted to Naive Bayesian classifiers alone and can, for instance, be used to calculate the Bayes error performance. We compare the analytical error rate to that obtained when Monte-Carlo simulations are performed for a 2 and 12 dimensional binary classification problem. Finally, we illustrate the robust performances obtained with Naive Bayesian classifiers (as opposed to a maximum likelihood classifier) for high dimensional problems when data sparsity becomes an issue. DA - 2008-11 DB - ResearchSpace DP - CSIR KW - Naive Bayesian classifiers KW - Gaussian features KW - Pattern recognition KW - PRASA 2008 LK - https://researchspace.csir.co.za PY - 2008 SM - 9780799223507 T1 - Binary naive Bayesian classifiers for correlated Gaussian features: a theoretical analysis TI - Binary naive Bayesian classifiers for correlated Gaussian features: a theoretical analysis UR - http://hdl.handle.net/10204/5543 ER - en_ZA


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