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Please use this identifier to cite or link to this item: http://hdl.handle.net/10204/5238

Title: Comparison of the accuracy of the calibration model on the double and single integrating sphere systems
Authors: Singh, A
Karsten, A
Keywords: Integrating sphere
Light tissue interaction
Calibration model
Photoelectronic detection
Laser imaging
Laser sensing
Photonics sensing
Photonics imaging
Issue Date: May-2011
Publisher: SPIE
Citation: Singh, A and Karsten, A. 2011. Comparison of the accuracy of the calibration model on the double and single integrating sphere systems. International Symposium on Photoelectronic Detection and Imaging: Laser Sensing and Imaging; and Biological and Medical Applications of Photonics Sensing and Imaging, May 24-26 2011, Beijing, China, May 2011. Proc. of SPIE Vol. 8192
Series/Report no.: Workflow request;7405
Abstract: The accuracy of the calibration model for the single and double integrating sphere systems are compared for a white light system. A calibration model is created from a matrix of samples with known absorption and reduced scattering coefficients. In this instance the samples are made using different concentrations of intralipid and black ink. The total and diffuse transmittance and reflectance is measured on both setups and the accuracy of each model compared by evaluating the prediction errors of the calibration model for the different systems. Current results indicate that the single integrating sphere setup is more accurate than the double system method. This is based on the low prediction errors of the model for the single sphere system for a He-Ne laser as well as a white light source. The model still needs to be refined for more absorption factors. Tests on the prediction accuracies were then determined by extracting the optical properties of solid resin based phantoms for each system. When these properties of the phantoms were used as input to the modeling software excellent agreement between measured and simulated data was found for the single sphere systems.
Description: Copyright: 2011 Society of Photo‑Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.
URI: http://hdl.handle.net/10204/5238
Appears in Collections:Laser physics and technology
General science, engineering & technology

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