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Please use this identifier to cite or link to this item: http://hdl.handle.net/10204/3678

Title: PBCO/YBCO bilayer growth and optimization for the fabrication of buffered step-edge Josephson junctions
Authors: Van Staden, WF
Buttner, U
Fourie, CJ
Srinivasu, VV
Hardie, GL
Perold, WJ
Keywords: YBCO
Josephson junction
Bilayer growth
X-ray diffractometry
XRD
Atomic force microscopy
AFM
Step-edge junction
Pulsed laser deposition
South African Conference on Semi and Superconductor Technology
SACSST 2009
Superconductor technology
Issue Date: Apr-2009
Publisher: Proceedings of the South African Conference on Semi and Superconductor Technology (SACSST) 2009
Citation: Van Staden, WF, Buttner, U, Fourie, CJ et al. 2009. PBCO/YBCO bilayer growth and optimization for the fabrication of buffered step-edge Josephson junctions. Proceedings of the South African Conference on Semi and Superconductor Technology (SACSST) 2009, Stellenbosch, South Africa, 8-9 April 2009, pp 102-104
Abstract: Bilayers of PBCO and YBCO are grown epitaxially on MgO substrates using PLD. In this paper, researchers discuss the entire optimization process in detail, giving quantitative parameter values. Film characterization included XRD, AFM and susceptance tests. The optimal process yielded bilayer structures which can be utilized in the fabrication of novel buffered step-edge Josephson junctions.
Description: Proceedings of the South African Conference on Semi and Superconductor Technology (SACSST) 2009, Stellenbosch, South Africa, 8-9 April 2009
URI: http://hdl.handle.net/10204/3678
ISBN: 9780620438650
Appears in Collections:National Centre for nano-structured materials
Nanotechnology
Manufacturing science and technology
General science, engineering & technology

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