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Please use this identifier to cite or link to this item:
http://hdl.handle.net/10204/3677
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| Title: | AFM plough YBCO micro bridges: substrate effects |
| Authors: | Elkaseh, A Buttner, U Srinivasu, VV Perold, WJ |
| Keywords: | Atomic force microscopy AFM YBCO Microbridges Josephson junction AFM nanolithography Substrate effects SACSST 2009 South African Conference on Semi and Superconductor Technology Superconductor technology |
| Issue Date: | Apr-2009 |
| Publisher: | South African Conference on Semi and Superconductor Technology (SACSST) 2009 |
| Citation: | Elkaseh, A, Buttner, U, Srinivasu, VV and Perold, WJ. 2009. AFM plough YBCO micro bridges: substrate effects. Proceedings of the South African Conference on Semi and Superconductor Technology (SACSST) 2009, Stellenbosch, South Africa, 8-9 April 2009, pp 91-94 |
| Abstract: | AFM nanolithography was used as a novel cutting technique to define micro-size YBCO superconducting constrictions. Researchers studied the substrate effects on MgO and STO substrates and showed that the observed Shapiro steps from the bridges on STO substrates are of poor quality when compared to those of MgO Substrates. This is because the STO substrate is microwave dirty and it is well known that the substrate has resonant microwave losses at low temperatures. |
| Description: | Proceedings of the South African Conference on Semi and Superconductor Technology (SACSST) 2009, Stellenbosch, South Africa, 8-9 April 2009 |
| URI: | http://hdl.handle.net/10204/3677 |
| ISSN: | 9780620438650 |
| Appears in Collections: | Sensor science and technology Manufacturing science and technology General science, engineering & technology
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