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Please use this identifier to cite or link to this item: http://hdl.handle.net/10204/3677

Title: AFM plough YBCO micro bridges: substrate effects
Authors: Elkaseh, A
Buttner, U
Srinivasu, VV
Perold, WJ
Keywords: Atomic force microscopy
AFM
YBCO
Microbridges
Josephson junction
AFM nanolithography
Substrate effects
SACSST 2009
South African Conference on Semi and Superconductor Technology
Superconductor technology
Issue Date: Apr-2009
Publisher: South African Conference on Semi and Superconductor Technology (SACSST) 2009
Citation: Elkaseh, A, Buttner, U, Srinivasu, VV and Perold, WJ. 2009. AFM plough YBCO micro bridges: substrate effects. Proceedings of the South African Conference on Semi and Superconductor Technology (SACSST) 2009, Stellenbosch, South Africa, 8-9 April 2009, pp 91-94
Abstract: AFM nanolithography was used as a novel cutting technique to define micro-size YBCO superconducting constrictions. Researchers studied the substrate effects on MgO and STO substrates and showed that the observed Shapiro steps from the bridges on STO substrates are of poor quality when compared to those of MgO Substrates. This is because the STO substrate is microwave dirty and it is well known that the substrate has resonant microwave losses at low temperatures.
Description: Proceedings of the South African Conference on Semi and Superconductor Technology (SACSST) 2009, Stellenbosch, South Africa, 8-9 April 2009
URI: http://hdl.handle.net/10204/3677
ISSN: 9780620438650
Appears in Collections:Sensor science and technology
Manufacturing science and technology
General science, engineering & technology

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