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Please use this identifier to cite or link to this item: http://hdl.handle.net/10204/2403

Title: Microstructural pavement material characterization: some examples
Authors: Mgangira, MB
Keywords: SEM
Scanning Electron Microscopy
Pavement materials
Measurement techniques
Issue Date: Jul-2008
Publisher: Southern African Transport Conference (SATC)
Citation: Mgangira, MB. 2008. Microstructural pavement material characterization: some examples. Partnership for research and progress in Transportation. 27th Southern African Transport Conference (SATC), Pretoria, South Africa, July 7-11, 2008, pp 12
Abstract: The utilisation of advanced measurement techniques should assist in the characterization of pavement materials at a micro-scale. The motivating factor for such an approach is that material properties at the micro-level have a critical role in the way materials respond to loading at the macro-level. The objective of the paper is to demonstrate how Scanning Electron Microscopy (SEM) as an example of advanced measurement techniques was used for material characterization. A range of samples of pavement engineering materials were examined at a micro-scale using the technique. Selected examples of material characterization are presented. The potential application of microstructural material characterization for the identification of key elements which provide the opportunity to understand fundamental behaviour of pavement engineering materials is demonstrated
Description: Paper presented at the 27th Annual Southern African Transport Conference 7 - 11 July 2008 "Partnership for research and progress in transportation", CSIR International Convention Centre, Pretoria, South Africa
URI: http://hdl.handle.net/10204/2403
ISBN: 978-1-920017-34-7
Appears in Collections:Infrastructure engineering
General science, engineering & technology

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