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Please use this identifier to cite or link to this item: http://hdl.handle.net/10204/1672

Title: Grain size, stress and creep in polycrystalline solids
Authors: Nabarro, FRN
Keywords: Peierls stresses
Sigma stresses
Polycrystalline solids
Grain size
Issue Date: Aug-2000
Publisher: AMER INST physics
Citation: Nabarro, FRN. 2000. Grain size, stress and creep in polycrystalline solids. Physics of the solid state, vol 42 (8), pp 1456-1459
Abstract: If a stress sigma is applied to a polycrystal of grain size L, the mode of creep deformation depends on the answers to the following questions: (i) Does sigma exceed the Peierls stress sigma (p); (ii) Does L exceed the dislocation spacing in a Taylor lattice stabilized by sigma (p); (iii) Does Lo exceed the value required for a Frank-Read or Bardeen-Herring source to operate within the grain? (iv) Does L (1/2) sigma exceed the Hall-Petch value required for slip to propagate across a grain boundary? The (L, sigma) plane is thus partitioned into regions in which different creep modes predominate.
URI: http://hdl.handle.net/10204/1672
http://hdl.handle.net/10204/1672
ISSN: 1063-7834
Appears in Collections:Manufacturing science and technology
General science, engineering & technology

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