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Investigation of carrier mobility degradation effects on MOSFET leakage simulations

Author: Twala, B ; Djonon Tsague, Hippolyte Date: 2016 The term carrier mobility generally alludes to both electron and hole mobility in semiconductors. These parameters characterize how quickly an electron and/or hole moves through a metal or semiconductor when under the influence of an electric ... Read more

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Browsing by Subject "Hole mobility"

Browsing by Subject "Hole mobility"

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