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PBCO/YBCO bilayer growth and optimization for the fabrication of buffered step-edge Josephson junctions

Author: Van Staden, WF ; Buttner, U ; Fourie, CJ ; Srinivasu, VV ; Hardie, GL ; Perold, WJ Date: Apr 2009 Bilayers of PBCO and YBCO are grown epitaxially on MgO substrates using PLD. In this paper, researchers discuss the entire optimization process in detail, giving quantitative parameter values. Film characterization included XRD, AFM and ... Read more

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Browsing by Subject "X-ray diffractometry"

Browsing by Subject "X-ray diffractometry"

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