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Comparison of various CEM methods to predict RCS of lossy dielectrics

Author: Pienaar, Ciara ; Odendaal, JW ; Joubert, J ; Pienaar, M ; Smit, Johan C Date: Sep 2017 The accuracy with which various full-wave and asymptotic CEM techniques can calculate the RCS of lossy dielectric objects is investigated. This is conducted through comparison to measured RCS data. The investigated methods include MLFMM, FEM, ... Read more

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Browsing by Subject "Dielectric scattering"

Browsing by Subject "Dielectric scattering"

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