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Summary of Schottky barrier height data on epitaxially grown n-and p-GaAs

Author: Myburg, G ; Auret, FD ; Meyer, WE ; Louw, CW ; Van Staden, MJ Date: 18 Jul 1998 The Schottky barrier height values, as determined by the current–voltage and capacitance–voltage techniques, of 43 metals which were fabricated by following the same cleaning procedure and using the same high-quality organ metallic vapour ... Read more

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Browsing by Subject "Metallizations"

Browsing by Subject "Metallizations"

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