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Browsing by Author "Willers, CJ"

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  • Mudau, AE; Mwakikunga, BW; Brink, N; Willers, CJ; Forbes, A; Shikwambana, L; Govender, M (SAIP 2010, 2010-09)
    In laser pyrolysis, temperature measurement and control plays a vital role during the development of nanoparticles. Authors present the results of temperature measurements using infrared camera on a tungsten hexa-ethoxide ...
  • Willers, CJ (Sensors, MEMS and Electro-optic Systems (SMEOS) Conference 2009, 2009-09)
    From its humble beginnings in an optical workshop in the Mowbray office for Triangulation in the 1930s and the subsequent formation of the Division for Optics and Spectroscopy at the National Physical Research Laboratory ...
  • Willers, CJ; Willers, MS; Santos, RAT; Van der Merwe, PJ; Calitz, JC; De Waal, A; Mudau, AE (SPIE Digital library, 2012-09)
    Electro-optical system design, data analysis and modelling involve a significant amount of calculation and processing. Many of these calculations are of a repetitive and general nature, suitable for including in a generic ...
  • Willers, CJ; Willers, MS; Lapierre, F (SPIE, 2011-09)
    The development and optimisation of modern infrared systems necessitates the use of simulation systems to create radiometrically realistic representations (e.g. images) of infrared scenes. Such simulation systems are used ...
  • Willers, CJ; Willers, MS (Society of Photo‑Optical Instrumentation Engineers (SPIE), 2012-11)
    The paper presents a description of an image-based simulation system, the Optronic System Simulator (OSSIM). OSSIM provides the ability to model the individual components in detail, but also accurately models the interaction ...
  • De Waal, A; Willers, CJ; Roodt, JHS; Mudau, AE (INCOSE South Africa, 2013-08)
    A commonly-used term in the simulation domain is ‘validation, verification and accreditation’ (VVA). When analysing simulation predictions for the purpose of system solution development and decision-making, one key question ...