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Global image feature extraction using slope pattern spectra

Author: Toudjeu, IT ; Van Wyk, BJ ; Van Wyk, MA ; Van Den Bergh, F Date: Jun 2008 Traditionally, granulometries are obtained using a series of openings or closings with convex structuring elements of increasing size. Granulometries constitute a useful tool for texture and image analysis since they are used to characterize ... Read more

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Browsing by Author "Toudjeu, IT"

Browsing by Author "Toudjeu, IT"

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