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Browsing by Author "Engelbrecht, JAA"

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  • Baisitse, TR; Forbes, A; Katumba, G; Botha, JR; Engelbrecht, JAA (John Wiley & Sons Ltd, 2008)
    In this paper, infrared reflectance spectroscopy was employed to extract information on the optical and electrical properties of metal organic vapour phase epitaxial (MOVPE) grown InAs and InAsSb epilayers. These epitaxial ...
  • Krug, T; Botha, L; Shamba, P; Baisitse, TR; Venter, A; Engelbrecht, JAA; Botha, JR (Elsevier Science BV, 2006)
    Strong surface inversion usually leads to deceptive Hall measurements by reflecting typical n-type behaviour for p-type samples, especially at very low doping concentrations. A two-layer model is presented which can ...